{"journal":{"journal_id":8200,"issn":"8756-6990","eissn":"1934-7944","name_en":"Optoelectronics Instrumentation and Data Processing","name_short":null,"name_zh":null,"first_year":2025,"last_year":2026,"n_years":2,"latest_if":0.4,"latest_if_year":2025,"first_partition":4,"last_partition":4,"trend":"stable","xr_partition":4,"xr_year":2026,"has_warning":false,"has_risk":false,"legacy_only":false,"jcr_quartile":4,"jcr_year":2026,"jcr_subjects":1},"current":{"journal_id":8200,"year":2026,"source":"xinrui","partition":4,"is_top":false,"is_review":false,"oaj":false,"open_access":false,"wos_index":null,"wos_status":"normal","tags":[],"seq":376,"macro":"物理与天体物理"},"meso":[],"history":[{"year":2025,"partition":4,"is_top":false,"macro":"物理与天体物理"}],"if_single":[{"if_year":2025,"value":0.4,"edition":2026}],"if_editions":[{"year":2025,"if_avg3":null,"citations":338.0}],"warnings":[],"aliases":[{"alias":"Optoelectronics Instrumentation and Data Processing","alias_type":"primary","src":"upgraded"}],"similar":[{"journal_id":8364,"name_en":"REVISTA MEXICANA DE FISICA","issn":"0035-001X","partition":4,"is_top":false,"warn":false,"shared":1},{"journal_id":21227,"name_en":"PHYSICS TODAY","issn":"0031-9228","partition":4,"is_top":false,"warn":false,"shared":1},{"journal_id":3474,"name_en":"Russian Physics Journal","issn":"1064-8887","partition":4,"is_top":false,"warn":false,"shared":1},{"journal_id":14289,"name_en":"ACTA PHYSICA POLONICA B","issn":"0587-4254","partition":4,"is_top":false,"warn":false,"shared":1},{"journal_id":13049,"name_en":"ACTA PHYSICA POLONICA A","issn":"0587-4246","partition":4,"is_top":false,"warn":false,"shared":1},{"journal_id":10572,"name_en":"COMPTES RENDUS PHYSIQUE","issn":"1631-0705","partition":4,"is_top":false,"warn":false,"shared":1},{"journal_id":12865,"name_en":"Romanian Journal of Physics","issn":"1221-146X","partition":4,"is_top":false,"warn":false,"shared":1},{"journal_id":1555,"name_en":"Physics","issn":"2624-8174","partition":4,"is_top":false,"warn":false,"shared":1}],"similar_year":2025,"jcr":[{"subject":"PHYSICS, MULTIDISCIPLINARY","quartile":4,"citations":338,"index_version":"ESCI","if_value":0.4,"if_year":2025,"year":2026}],"jcr_years":[2026],"jcr_year":2026,"plan":{"cas":[2025,"cas"],"xinrui":[2026,"xinrui"],"jcr":2026,"cas_years":[2025,2023,2022,2021,2020,2019],"xinrui_years":[2026]},"plan_rows":{"cas":{"journal_id":8200,"year":2025,"source":"cas","partition":4,"is_top":false,"is_review":false,"oaj":false,"open_access":false,"wos_index":"ESCI","wos_status":"normal","tags":[],"seq":null,"macro":"物理与天体物理"},"xinrui":{"journal_id":8200,"year":2026,"source":"xinrui","partition":4,"is_top":false,"is_review":false,"oaj":false,"open_access":false,"wos_index":null,"wos_status":"normal","tags":[],"seq":376,"macro":"物理与天体物理"}},"mode":"latest","year":2026,"source":"xinrui","editions":[{"year":2026,"source":"xinrui","partition":4,"seq":376,"macro":"物理与天体物理"},{"year":2025,"source":"cas","partition":4,"seq":null,"macro":"物理与天体物理"}],"submission":{"entry":{"homepage_url":"https://link.springer.com/journal/volumesAndIssues/11974","submission_url":null,"submission_kind":null,"author_guide_url":null,"confidence":null,"checked_at":null},"cost":{"is_oa":"NO","required":null,"apc_min":null,"apc_max":null,"currency":null,"usd_est":null,"note":null,"waiver":null,"other_charges":null},"timeline":{"first_decision_days":null,"to_accept_days":null,"online_weeks":null,"text":null,"kind":null,"acceptance_rate_pct":null},"publishing":{"publisher":"Pleiades Publishing","country":"United States","language":null,"issn_print":null,"issn_electronic":null},"keywords":{"topics":"Photonic and Optical Devices; Advanced Data Processing Techniques; Advanced Computational Techniques in Science and Engineering; Semiconductor Quantum Structures and Devices; Optical and Acousto-Optic Technologies; Advanced Semiconductor Detectors and Materials; Infrared Target Detection Methodologies; Optical measurement and interference techniques; Image and Signal Denoising Methods; Advanced Fiber Laser Technologies; Advanced Measurement and Metrology Techniques; Calibration and Measurement Techniques; Photorefractive and Nonlinear Optics; Advanced Scientific Research Methods; Sensor Technology and Measurement Systems; Advanced optical system design; Optical Polarization and Ellipsometry; Material Properties and Applications; Advanced Image Fusion Techniques; Laser Material Processing Techniques; Advanced Optical Imaging Technologies; Advanced Measurement and Detection Methods; Remote-Sensing Image Classification; Engineering Technology and Methodologies; Silicon Nanostructures and Photoluminescence","scope_text":null,"article_types":null},"completeness":50,"updated_at":"2026-09-16T14:23:27.695223+00:00"}}