JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS

主题词：VLSI and Analog Circuit Testing; Integrated Circuits and Semiconductor Failure Analysis; Radiation Effects in Electronics; Low-power high-performance VLSI design; Physical Unclonable Functions (PUFs) and Hardware Security; VLSI and FPGA Design Techniques; Engineering and Test Systems; Semiconductor materials and devices; Advancements in Semiconductor Devices and Circuit Design; Software Testing and Debugging Techniques; Analog and Mixed-Signal Circuit Design; Embedded Systems Design Techniques; Educational Technology and Assessment; Interconnection Networks and Systems; Advancements in PLL and VCO Technologies; Diverse Scientific and Economic Studies; Human auditory perception and evaluation; Formal Methods in Verification; Electrostatic Discharge in Electronics; Radio Frequency Integrated Circuit Design; Software Reliability and Analysis Research; Cryptographic Implementations and Security; Advanced Memory and Neural Computing; Advancements in Photolithography Techniques; 3D IC and TSV technologies