Journal of Surface Investigation

主题词：Ion-surface interactions and analysis; Metal and Thin Film Mechanics; Electron and X-Ray Spectroscopy Techniques; Diamond and Carbon-based Materials Research; Nuclear Physics and Applications; Crystallography and Radiation Phenomena; Advanced X-ray Imaging Techniques; Semiconductor materials and devices; X-ray Spectroscopy and Fluorescence Analysis; Semiconductor materials and interfaces; nanoparticles nucleation surface interactions; Fusion materials and technologies; Advanced materials and composites; Integrated Circuits and Semiconductor Failure Analysis; Carbon Nanotubes in Composites; Nuclear Materials and Properties; X-ray Diffraction in Crystallography; Silicon Nanostructures and Photoluminescence; Semiconductor Quantum Structures and Devices; Silicon and Solar Cell Technologies; Chalcogenide Semiconductor Thin Films; Advanced Materials Characterization Techniques; Advancements in Photolithography Techniques; Surface and Thin Film Phenomena; ZnO doping and properties